Description
As part of the materials characterization team, you will function as the subject matter expert for structural characterization and chemical analysis of lithium-ion battery materials and systems, with a strong foundation in Raman spectroscopy and complementary techniques including SEM, FIB-SEM, and FTIR. You will develop methods based on project needs to build a deep understanding of failure mechanisms and root causes in lithium-ion batteries, while also reviewing data from other analysts and coordinating the use of multiple techniques to drive materials understanding and causations between materials properties and performance.
Minimum Qualifications
BS in chemistry, materials science, chemical engineering, or related field, with a minimum of 3 years of relevant industry experience. Experience with Raman spectroscopy or relevant. Experience with at least one characterization technique - SEM, FTIR or XRD.
Preferred Qualifications
M.S. or Ph.D. in chemistry, materials science, chemical engineering, or related field, with graduate-level coursework or research involving Raman spectroscopy and electron microscopy applied to energy storage materials Deep knowledge of Raman spectroscopy for Li-ion battery materials, including interpretation of spectra for common materials (e.g., graphite, silicon, NMC/NCA cathodes, LFP, solid electrolytes) Hands-on experience with SEM and FIB-SEM, including sample preparation, cross-sectioning, imaging, and EDS analysis of battery materials Proficiency in FTIR spectroscopy (transmission, ATR, and/or microscopy modes) for chemical characterization of battery-relevant materials Demonstrated track record of applying Raman and complementary characterization techniques (SEM, FIB-SEM, FTIR) to solve critical problems in battery material development and/or identification of battery degradation mechanisms Experience handling and preparing air-sensitive battery materials (glovebox operation, inert atmosphere sample transfer) Experience with additional characterization techniques such as XRD, XPS, TEM, or optical microscopy
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